E12200 - SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM) Revision:SEMI E122-0217 - Superseded or in an ad hoc

or in an ad hoc request from the EDA Application

the specified edge width is used to determine the regions of the measured edge profile to be fitted and the coordinates of the reference point locations are derived from fitted regions of the measured edge profile

It covers terminology related to plastic substrates of flexible display

SEMI D67-0212 (first published)

E12200 - SEMI E122 - Specification for Tester Equipment Specific Equipment Model (TSEM) Revision:SEMI E122-0217 - Superseded or in an ad hocThis Standard establishes a Specific Equipment Model for testing equipment (TSEM). The TSEM consists of equipment characteristics and behaviors that apply to this class of equipment. These characteristics and behaviors are required to be implemented. The intent of this Standard is to facilitate the integration of testing equipment into an automated semiconductor factory. This Standard accomplishes this by defining an operational model for testing