G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Revision:SEMI G52-1120 - Current and proof pressure of pressure

and proof pressure of pressure transducers with a full pressure range of 2757

Capacity tests are done by adding ppm levels of a given gaseous impurity to a pure zero gas and monitoring the effluent of the test purifier for active impurity species

本書面の範囲は半導体産業で使用する全グレードのDMSOである。

originally published in 1995

G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Revision:SEMI G52-1120 - Current and proof pressure of pressureContamination on leadframes can contribute to semiconductor device reliability problems. This Test Method may be used by lead frame manufacturers at outgoing inspection and by users at incoming inspection. Correlation of device reliability with contamination levels may lead to improved leadframe cleaning processes. This Standard describes the procedure to determine ionic contamination on leadframes using a water extraction method. The method is