JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} img{max-width:100%} Applied Materials 0020-45744

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JEOL Inspection Stage Chamber Assembly JWS-2000 Wafer Defect Review SEM Working img{max-width:100%} img{max-width:100%} Applied Materials 0020-45744JEOL Inspection Stage Chamber Assembly JWS 2000 Wafer Defect Review SEM Working Inventory # CONF 1322 Part No: Inspection Stage Chamber Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System Installed Components Copal Electronics Part No: PS83 102V Keyence Part No: FS V31 Koganei Part No: JDAS12x5 74W Omron Part No: E3X A11 Oriental Motor Part No: PX535MH B, VEXTA SMC Part No: CDRQB20 01 476 This JEOL