D05700 - SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection Revision:SEMI D57-0823 - Current Due to the migration to

Due to the migration to large wafer sizes

本スタンダードは450mm用テープフレームカセット（450TFC）のロードおよびアンロードを行う半導体製造装置において，ロードポートの機械的なインタフェースを定義したものである。この定義により，ロードポートとキャリアの相互運用性を確保し，450TFCを用いた自動化が促進されることを目的とする。

SEMI E125-0704 (technical revision)

SEMI C21-0708 (technical revision)

D05700 - SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection Revision:SEMI D57-0823 - Current Due to the migration toSpecific definitions and quantifications of Mura are not consistent for many FPD manufacturers. Though there are standards for quantification of Mura, they are only used for limited types of Mura and are not practical in real varied cases. Currently it is still difficult to implement instruments to replace human inspectors for Mura inspections of LCDs. Therefore, it is necessary to standardize the classification of Mura for LCD. This Standard focuses