US$ 27.00
F11100 - SEMI F111 - Test Method for Equipment Fan Filter Unit (EFFU) Particle Removal StdPbc-0725 Producers and users of the
$193.00
Description
Producers and users of the silicon wafers and reticles used in semiconductor manufacturing will also find it useful
port converters and other components for 1
but are not limited to:
and oxidizing gas
F11100 - SEMI F111 - Test Method for Equipment Fan Filter Unit (EFFU) Particle Removal StdPbc-0725 Producers and users of theThis Test Method covers a procedure for measuring particle removal characteristic of equipment fan filter unit (EFFU) installed inside equipment. Since EFFU is an assembly of particle filter, fan, and motor, the integrity of these parts is very important for the performance of EFFU. So a conventional particle removal test method for particle filters is not suitable to evaluate EFFU particle removal performance. This Test Method defines an evaluation
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