G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages StdPbc-0118 orgで入手可能になり。初版は1994年発行。

orgで入手可能になり。初版は1994年発行。

3  A simple tuning mechanism is provided for limited feedforward and feedback control between process steps

SEMI MF523 — Practice for Unaided Visual Inspection of Polished Silicon Wafers Surfaces

and other relevant information such as tracking reticle usage

G02300 - SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages StdPbc-0118 orgで入手可能になり。初版は1994年発行。This Test Method describes the measurement method for the inductance of internal traces of semiconductor packages. This Test Method is applicable for the measurement of package inductance that is greater than 0. 5 nH. This Test Method describes the measurement of a pin grid array, one of the package types, as a sample. This Test Method is also applicable to other types of packages. The inductance in this Standard is limited to that of internal traces