G07900 - SEMI G79 - Specification for Overall Digital Timing Accuracy Revision:SEMI G79-0200 - Inactive A brief description of the

A brief description of the theory of this Test Method is given in Related Information 1

as technology advances to smaller and smaller dimensions for the elements of high density integrated circuits

Although nanotopography measurements have not been needed for 0

SEMI E83-0714 (technical revision)

G07900 - SEMI G79 - Specification for Overall Digital Timing Accuracy Revision:SEMI G79-0200 - Inactive A brief description of theThis Standard was technically approved by the global Automated Test Equipment Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 24, 2011. Available at www. semiviews. org and www. semi. org in May 2012; originally published February 2000. This Standard is intended to provide a minimum common definition of timing accuracy specifications for semiconductor automatic test equipment