E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current •Identify the various processes involved

•Identify the various processes involved in laminate manufacturing

1  Introduction

This Document specifies the external features and dimensions of the 450 mm carrier

SEMI MF42-02 (first SEMI publication)

E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-0123 - Current •Identify the various processes involvedThis Specification describes a data and event sharing and streaming methodology for semiconductor test and related operations. The scheme fully supports legacy equipment and allows equipment vendors the flexibility to provide additional data items via extensions. Real time, historical, and widely distributed data are fully supported. Provenance of all data is supported via customizable metadata along with cryptographic hashing and signing.