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G08600 - SEMI G86 - シリコンチップ（ダイ）の三点曲げテスト方法 Revision:SEMI G86-0303 - Superseded 6 A number of the
G08600 - SEMI G86 - シリコンチップ（ダイ）の三点曲げテスト方法 Revision:SEMI G86-0303 - Superseded 6 A number of the
$115.50
Description
6 A number of the required standard test methods do not exist at present
This Test Method is applicable to slices of silicon with resistivity higher than 3 ·cm for p-type and higher than 1 ·cm for n-type
identification
Data Matrix symbology is applicable to a broad range of FPD products including virgin substrates
G08600 - SEMI G86 - シリコンチップ（ダイ）の三点曲げテスト方法 Revision:SEMI G86-0303 - Superseded 6 A number of theGlobal Assembly and Packaging CommitteeJapanese Packaging Committee2003 110Japanese Regional Standards Committee20031 www. semi. org20033 Referenced SEMI Standards None.
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