G03800 - SEMI G38 - Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages StdPbc-1111 processing

processing

colorless gas

The contrast ratio has been widely used although the calculated value is dramatically changed by dark state luminance

loader/unloader and robot)

G03800 - SEMI G38 - Test Method for Still- and Forced-Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuit Packages StdPbc-1111 processingNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. The purpose of this Test Method is to determine the thermal resistance of integrated circuit packages using thermal test chips. This Test Method deals only with junction to ambient measurements of thermal resistance and