M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals StdPbc-0716 行のフォーマットおよび項目の番号付けの指示事項。

行のフォーマットおよび項目の番号付けの指示事項。

본 에디션은 글로벌 감사 및 평가 소위원회(Audits and Reviews Subcommittee)가 2015년 1월 5일에 간행을 승인했으며 2015년 2월에 www

The interface must address the proper container orientation for material transfer and maintain continuity between the container and equipment environment in order to control particulate matter

This creates an ambiguity in measuring the edge lengths and other geometrical dimensions of wafers

M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals StdPbc-0716 行のフォーマットおよび項目の番号付けの指示事項。This test method was technically approved by the global Compound Semiconductor Committee and is the direct responsibility of the Japanese Compound Semiconductor Committee. Current edition approved by the Japanese Regional Standards Committee on June 1, 1999. Initially available at www. semi. org August 1999; to be published September 1999. The purpose of this document is to specify a method to measure resistivity and determine Hall mobility of semi