GKR2202A2 Zara Gold
US$ 1224.50
G00300 - SEMI G3 - 仕様 側面ろう付け積層板 Revision:SEMI G3-90 - Inactive SEMI G59 — Test Method
$115.50
Description
SEMI G59 — Test Method for Measurement of Ionic Contamination on Leadframe Interleafing and the Contamination Transferred from the Interleafing to the Leadframes
本文書の目的は，半導体産業で使用されるシラン(SiH4)の仕様を提供するものである。
本ガイドラインは，ポジレジスト（positive photoresist）を意図している。
previously published November 2003
G00300 - SEMI G3 - 仕様 側面ろう付け積層板 Revision:SEMI G3-90 - Inactive SEMI G59 — Test MethodCurrentInactiveInactiveSEMI 7. 62 mm (0. 003 in.)10. 16 mm (0. 400 in.)15. 24 mm (0. 600 in.)22. 86 mm (0. 900 in.) Referenced SEMI Standards None.
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