JEOL AP002778-00 ARCNET ITF PB PCB Card JWS-2000 Wafer Detect SEM Working Spare Part No: DB1C-3024-C000 (Qty

Part No: DB1C-3024-C000 (Qty

Model No: 4022 471 69481

img{max-width:100%}img{max-width:100%} Hitachi High Technologies 2-A00624-90 300mm DZ-ISL Electrode Cover Hitachi M-712 Etcher new

Removed from a TEL Tokyo Electron Clean Track Lithius 300mm System

JEOL AP002778-00 ARCNET ITF PB PCB Card JWS-2000 Wafer Detect SEM Working Spare Part No: DB1C-3024-C000 (QtyJEOL AP002778 00 ARCNET ITF PB PCB Card JWS 2000 Wafer Detect SEM Working Spare Inventory # CONF 1266 Part No: AP002778 00 Model No: ARCNET ITF PB Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL AP002778 00 ARCNET ITF PB PCB Card is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty