G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded SEMI G15-93 (Reapproved 0811)

SEMI G15-93 (Reapproved 0811)

SEMI MF391 — Test Method of Minority Carrier Diffusion Length in Extrinsic Semiconductors by Steady-State Surface Photovoltage

which is biologically and ecologically very hazardous

Cracked wafers are sometimes broken in module fabrication process causing lower productivity and cost increases

G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded SEMI G15-93 (Reapproved 0811)NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This procedure will define a standard process whereby any logic integrated circuit (IC) automatic test equipment (ATE) system can be evaluated for parameters that makeup an alternating current (AC) timing accuracy