Semiconductor Metrology Basics StdPbc-0520 no materials requirements or microcontamination
$120.00
Description
no materials requirements or microcontamination limits are given
The assumption of wafer-to-wafer (W2W)
This course focuses on how to read a vernier scale
the results of this Test Method may not be a measure of the total carbon concentration at such concentrations
Semiconductor Metrology Basics StdPbc-0520 no materials requirements or microcontaminationCourse Description The THORS Semiconductor Metrology Basics course introduces the learners to the significance of testing in semiconductor manufacturing. This course focuses on key measurements in semiconductor metrology for defect inspection and process control. Presented in THORS' highly visual and interactive learning format, this course will equip the learners with a foundational knowledge of semiconductor metrology. Learning Objectives Recognize
Shipping Notes
- Free Standard Shipping on $100+ Orders to the USA.
- Except Preorder products are shipped in 48 hours.
- Delivery to the USA:
- Standard Shipping : 3-10 business days
- If time is of the essence, please consider selecting expedited delivery for faster service.
