Semiconductor devices. Mechanical and climatic test methods - Board level drop test method using an accelerometer Ingestion-build-51747 functions for train operation

functions for train operation

for example when combining information security with quality (BS EN ISO 9001:2015) or environmental management (BS EN ISO 14001:2015)

Industries working with discharge lamps

— ISO 15867

Semiconductor devices. Mechanical and climatic test methods - Board level drop test method using an accelerometer Ingestion-build-51747 functions for train operation1 Scope and object This part of IEC 60749 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface