Semiconductor devices - Mechanical and climatic test methods - Guidelines for IC reliability qualification plans Ingestion-build-105964 by recommending compliance with this

by recommending compliance with this PAS

Provide recognition of compliance policies and procedures

This part of IEC 61935 specifies additional reference measurement procedures for measurement of resistance unbalance with field test instrumentation

Updates have been made to bring the document in line with current-generation technologies

Semiconductor devices - Mechanical and climatic test methods - Guidelines for IC reliability qualification plans Ingestion-build-105964 by recommending compliance with this1 Scope This part of IEC 60749 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military and space related applications. NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE