Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 Tables where the structure is

Tables where the structure is intended to support a parasol

and interpreting the data generated by near field scan (NFS) measurement

c)      The definition of which average detector is used for emission measurements at frequencies above 1GHz and that results using a peak detector are acceptable for all measurements

Who is PD IEC/TR 61968-900- Application integration at electric utilities for

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 Tables where the structure is1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.