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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 used in several areas of
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 used in several areas of
$166.00
Description
used in several areas of construction and frequently used in standards
power and specific power
when these are not electrically isolated from the structure
lightly impregnated with resin to provide mechanical stability
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Ingestion-build-143074 used in several areas of
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