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BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method Ingestion-build-242630 4 and divided into 5
BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method Ingestion-build-242630 4 and divided into 5
$20.00
Description
4 and divided into 5
ISO and other sources
By using BS EN 4834
Consistency of Clause 9 Marking has been improved
BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method Ingestion-build-242630 4 and divided into 5
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