Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor Ingestion-build-242630 What is this BS 8233

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Semiconductor devices. Flexible and stretchable semiconductor devices - Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor Ingestion-build-242630 What is this BS 8233What is this standard about? This part of IEC 62951 specifies evaluation conditions and gives a method of measurement as well as a test set up for the measurement of barrier performance for thin film layer with ultra low permeation rate under both flat and bending conditions. This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures. For these purposes, this document provides terms,