Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 BS EN 1303:2015 supersedes BS

BS EN 1303:2015 supersedes BS EN 1303:2005

TCP-UDP/IP based communication profile has been defined

Bulb reflector infra-red lamps

This standard applies to equipment and combinations of equipment where deflagrations may occur and is not applicable to equipment and combination of equipment where detonation may occur

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 BS EN 1303:2015 supersedes BS1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.