Integrated circuits. Measurement of electromagnetic immunity - General conditions and definitions Ingestion-build-126766 requirements and test methods are

requirements and test methods are not defined in this Publicly Available Specification

Figure 1 — CDIF family of International Standards

NOTE 1Materials include semi-finished products

BS EN 62220-1-3 specifies the method for the determination of the DETECTIVE QUANTUM EFFICIENCY (DQE) of DIGITAL X-RAY IMAGING DEVICES as a function of AIR KERMA and of SPATIAL FREQUENCY for the working conditions in the range of the medical application as specified by the MANUFACTURER

Integrated circuits. Measurement of electromagnetic immunity - General conditions and definitions Ingestion-build-126766 requirements and test methods areWhat is BS EN 62132 1 Integrated circuits about? BS EN 62132 1 is the first part of an international standard used for integrated circuits that specifies the test methods and procedure for measuring the immunity of these circuits. BS EN 62132 1 is useful in producing good quality circuits used in electronic devices. BS EN 62132 1 provides general information and definitions about the measurement of electromagnetic immunity of integrated circuits (ICs)